Do you need solutions for quality metallographic sample preparation?
Faced with the constant evolution of materials and quality standards, LAM PLAN is
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Compact high-end model of the SURFCOM TOUCH series with high resolution and straightness
Standard skidless type with a high-performance, high-resolution, wide-range probe. Different types of parts can be measured by substituting the tip for long and small holes or curved surfaces.
Address Z | ±500 µm (±1000µm in option) |
Address X | 50 mm |
Length of evaluation | 0.1 to 50 mm |
Accuracy of straightness | 0.3 µm/50 mm |
Probe vertical movement volume | 50 mm |
Measuring speed | 0.15; 0.3; 0.6; 1.5; 3/0.05; 0.1; 0.2; 0.5; 1 mm/s (variable) |
Detection type | Differential inductance |
Method of measurement | With/without skid (optional) |
Z-direction resolution | 0.0001 µm/±40 µm, 0.00125 µm/±500 µm |
Model | DM43801 |
Measured force | 0.75 mN |
Radio | r = 2 µm |
Angle | 60° cone |
Material | Diamond |
Faced with the constant evolution of materials and quality standards, LAM PLAN is
Faced with the constant evolution of materials and quality standards, LAM PLAN is
Faced with the constant evolution of materials and quality standards, LAM PLAN is